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Event

DistribuTECH: "Exploring the Capabilities of Next-Generation AMI with Distributed Intelligence"

Start:  2/7/2023

End:  12/7/2022

Location:  San Diego, CA

Type:  Speaker

Presenter:  Natalie Hammer, Senior Manager, AMI Strategy and Data Analytics, Commonwealth Edison; Jason Stanislaus, General Engineer, Commonwealth Edison; Mel Gehrs, Technical Sales Engineer, Itron

Primary Contact:  Becca Jones

Join Commonwealth Edison and Itron on Tuesday, February 7 from 12:00pm-1:00pm PT in the Grid Edge Technologies hub (booth #2747) for a lunch & learn on "Exploring the Capabilities of Next-Generation AMI with Distributed Intelligence".

Distributed Intelligence (DI) represents a new generation of the smart/active grid that has the ability to solve value-based use cases at the grid edge through a secure, open enterprise application platform with edge computing capability. ComEd aspires to maximize the value of its AMI investments and plan for prudent future investments in light of an evolving technological landscape, expanding customer needs, and the need for advanced grid management. Currently, ComEd is exploring the capabilities of distributed intelligence meters through a proof-of-concept initiative to gain an understanding of the DI ecosystem and test the technology for potential field deployment in the future. Since this is the second generation of smart meter technology for ComEd, a majority of the initial DI technology testing will be performed in a lab setting prior to moving the meters into production for testing in the field. In order to accurately conduct the proof of concept for DI use cases utilizing edge-computing technology, a new method of testing using a Meter Electric Board (MEB) has been implemented. The MEB allows for the setup of looping test sequences in which variables such as voltage and current can be manipulated to simulate a variety of electrical conditions that occur in the field. With the use of engineering theory and the MEB, lab testing of use cases such as high impedance conditions can be simulated without the need for a customized testing apparatus.
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